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Syndrome signature in output compaction for VLSI BIST.

Sunil R. DasNishith GoelWen-Ben JoneAmiya R. Nayak
Published in: VLSI Design (1996)
Keyphrases
  • vlsi design
  • artificial intelligence
  • cluster analysis
  • vlsi circuits
  • multiscale
  • signal processing
  • image processing
  • high speed
  • signature recognition