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Suppression of Edge Effects Based on Analytic Model for Leakage Current Reduction of Sub-40 nm DRAM Device.

Soo-Han ChoiYoung Hee ParkChul-Hong ParkSang Hoon LeeMoon-Hyun YooJun Dong ChoGyu Tae Kim
Published in: IEICE Trans. Electron. (2010)
Keyphrases
  • probabilistic model
  • edge detection
  • high speed
  • real time
  • image processing
  • data structure