On the relationship between two control-flow coverage criteria: all JJ-paths and MCDC.

Martin R. Woodward Michael A. Hennell

Published in: Inf. Softw. Technol. (2006)

Keyphrases

control flow
data flow
software testing
process model
transition systems
workflow management systems
shortest path
formal semantics
business process models
open source
reactive systems
modeling language
test suite
databases
temporal logic
test cases
case study
machine learning