Reducing device yield fallout at wafer level test with electrohydrodynamic (EHD) cleaning.

Jerry J. Broz James C. Andersen Reynaldo M. Rincon

Published in: ITC (2000)

Keyphrases

higher level
levels of abstraction
neural network
fine grained
significantly reduced
data sets
artificial intelligence
multimedia
database systems
similarity measure
data model
statistical tests
massively parallel