Reynaldo M. Rincon

Publication Activity (10 Years)

Years Active: 1999-2000
Publications (10 Years): 0

Publications

Jerry J. Broz, James C. Andersen, Reynaldo M. Rincon
Reducing device yield fallout at wafer level test with electrohydrodynamic (EHD) cleaning. ITC (2000)
Jerry J. Broz, Reynaldo M. Rincon
Probe contact resistance variations during elevated temperature wafer test. ITC (1999)