A Self-Organising Map Based Algorithm for Analysis of ICmetrics Features.
Xiaojun ZhaiKofi AppiahShoaib EhsanWah M. CheungHuosheng HuDongbing GuKlaus D. McDonald-MaierGareth HowellsPublished in: EST (2013)
Keyphrases
- high accuracy
- learning algorithm
- computational complexity
- k means
- experimental evaluation
- computationally efficient
- image features
- extracted features
- recognition algorithm
- convergence rate
- key features
- image matching
- detection algorithm
- segmentation algorithm
- dynamic programming
- significant improvement
- preprocessing
- data analysis
- optimal solution
- feature extraction