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Design Concept for Radiation-Hardening of Triple Modular Redundancy TSPC Flip-Flops.
Oliver Schrape
Marko S. Andjelkovic
Anselm Breitenreiter
Alexey Balashov
Milos Krstic
Published in:
DSD (2020)
Keyphrases
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neural network
design process
infrared
case study
pattern recognition
relational databases
image analysis
power consumption
machine vision
intelligent control