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Oxide reliability: influence of interface roughness, structure layout, and depletion layer formation.

Bakuri LanchavaPeter BaumgartnerAndreas MartinArmand BeyerErich Mueller
Published in: Microelectron. Reliab. (2001)
Keyphrases
  • neural network
  • bayesian networks
  • multi layer
  • database
  • case study
  • database systems
  • data structure
  • metal oxide