Bakuri Lanchava

Publication Activity (10 Years)

Years Active: 2001-2001
Publications (10 Years): 0

Publications

Bakuri Lanchava, Peter Baumgartner, Andreas Martin, Armand Beyer, Erich Mueller
Oxide reliability: influence of interface roughness, structure layout, and depletion layer formation. Microelectron. Reliab. 41 (7) (2001)