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Bakuri Lanchava
Publication Activity (10 Years)
Years Active: 2001-2001
Publications (10 Years): 0
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Publications
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Bakuri Lanchava
,
Peter Baumgartner
,
Andreas Martin
,
Armand Beyer
,
Erich Mueller
Oxide reliability: influence of interface roughness, structure layout, and depletion layer formation.
Microelectron. Reliab.
41 (7) (2001)