Evaluation of Nanosheet and Forksheet Width Modulation for Digital IC Design in the Sub-3-nm Era.
Giuliano SistoOdysseas ZografosBilal ChehabNaveen KakarlaYang XiangDragomir MilojevicPieter WeckxGeert HellingsJulien RyckaertPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2022)