Automatic Inspection for etching transistors in TFT-LCD Panel Using Binary Tree Structure and Bintree Searching and Gradient Orientation Code.
C.-S. LinC.-W. TsaiC.-M. TsengC.-C. ChiuS.-C. ChangPublished in: Int. J. Robotics Autom. (2010)
Keyphrases
- tree structure
- automatic inspection
- gradient orientation
- tft lcd
- integrated circuit
- tree representation
- vision system
- data structure
- frequent patterns
- tree structures
- thin film transistor
- xml documents
- stock price
- high density
- thin film
- index structure
- power consumption
- goal programming
- r tree
- binary tree
- real time
- machine learning
- supply chain
- data mining
- neural network