A New Complete Condition Monitoring Method for SiC Power MOSFETs.
Enes UgurChi XuFei YangShi PuBilal AkinPublished in: IEEE Trans. Ind. Electron. (2021)
Keyphrases
- condition monitoring
- clustering method
- cost function
- support vector machine
- high accuracy
- pairwise
- genetic algorithm
- significant improvement
- computational cost
- probabilistic model
- computational complexity
- detection method
- segmentation method
- wavelet analysis
- preprocessing
- neural network
- edge detection
- multiscale
- image enhancement
- power consumption