SDC-TPG: A Deterministic Zero-Inflation Parallel Test Pattern Generator.

Chun-Hao Chang Kuen-Wei Yeh Jiun-Lang Huang Laung-Terng Wang

Published in: ATS (2015)

Keyphrases

pattern generator
parallel processing
parallel implementation
data sets
learning algorithm
computer vision
lower bound
image analysis
test cases
black box
shared memory
parallel computing
computer architecture