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A Performance Comparative at Low Temperatures of Two FET Technologies: 65 nm and 14 nm.

Omar López-LIsmael MartínezDaniel Durini RomeroEdmundo Antonio Gutiérrez-DomínguezD. FerruscaMiguel VelázquezFrancisco Javier de la Hidalga WadeVictor Gómez
Published in: CCE (2020)
Keyphrases
  • data sets
  • st century
  • decision making
  • image processing
  • transmission electron microscopy
  • metal oxide