A Performance Comparative at Low Temperatures of Two FET Technologies: 65 nm and 14 nm.
Omar López-LIsmael MartínezDaniel Durini RomeroEdmundo Antonio Gutiérrez-DomínguezD. FerruscaMiguel VelázquezFrancisco Javier de la Hidalga WadeVictor GómezPublished in: CCE (2020)