Test of low power circuits: Issues and industrial practices.
Alberto BosioPatrick GirardArnaud VirazelPublished in: ICECS (2016)
Keyphrases
- low power
- high speed
- logic circuits
- low cost
- power consumption
- vlsi circuits
- cmos technology
- power reduction
- delay insensitive
- power dissipation
- mixed signal
- single chip
- digital signal processing
- wireless transmission
- high power
- gate array
- low power consumption
- vlsi architecture
- image sensor
- real time
- energy dissipation
- multi channel