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Chip-level characterization and RTN-induced error mitigation beyond 20nm floating gate flash memory.
T. W. Lin
S. H. Ku
C. H. Cheng
C. W. Lee
Ijen Huang
Wen-Jer Tsai
T. C. Lu
W. P. Lu
K. C. Chen
Tahui Wang
Chih-Yuan Lu
Published in:
IRPS (2018)
Keyphrases
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flash memory
garbage collection
disk drives
main memory
file system
random access
solid state
low cost
circuit design
database systems
high speed
similarity search
real time
data storage
wireless sensor networks
cmos technology
data structure