A soft measurement of small out-line transistor in surface mount technology.

Chao Xu Lifei Bai Zhihao Zhang Boxuan Han

Published in: IECON (2017)

Keyphrases

three dimensional
case study
cost effective
closely spaced
surface reconstruction
small number
data processing
low power
key technologies
viewpoint
high speed
computer systems
real time
range data
d objects
reconstruction method
cross section
silicon dioxide