Reducing Cost of Yield Enhancement in 3-D Stacked Memories Via Asymmetric Layer Repair Capability.
Muhammad Tauseef RabAsad Amin BawaNur A. ToubaPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2014)
Keyphrases
- image enhancement
- total cost
- application layer
- preventive maintenance
- cost reduction
- social networks
- image processing
- high cost
- multi objective
- storage space
- multi class
- minimal cost
- failure rate
- minimum cost
- cost sensitive
- databases
- search algorithm
- reinforcement learning
- multiscale
- artificial intelligence
- learning algorithm
- genetic algorithm
- machine learning