Improving Deep Metric Learning by Divide and Conquer.
Artsiom SanakoyeuPingchuan MaVadim TschernezkiBjörn OmmerPublished in: IEEE Trans. Pattern Anal. Mach. Intell. (2022)
Keyphrases
- metric learning
- distance metric learning
- distance metric
- semi supervised
- learning tasks
- machine learning and pattern recognition
- pairwise
- person re identification
- multi task
- distance function
- dimensionality reduction
- semi supervised clustering
- nearest neighbor classification
- feature space
- maximum variance unfolding
- semi supervised learning
- neural network
- kernel learning
- euclidean distance
- labeled data
- active learning
- learning algorithm