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Overcoming post-silicon validation challenges through quick error detection (QED).

David LinTed HongYanjing LiFarzan FallahDonald S. GardnerNagib HakimSubhasish Mitra
Published in: DATE (2013)
Keyphrases
  • error detection
  • error correction
  • error recovery
  • data cleansing
  • fault tolerance
  • error correcting
  • lessons learned
  • error control
  • high speed
  • asymptotic analysis
  • low cost
  • fault isolation