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Modelling of Electron Injection and Confinement in Cryogenic 22-nm FD-SOI Quantum Dot Arrays.

Conor PowerDennis Andrade-MiceliImran BashirMike AskerDirk LeipoldRobert Bogdan StaszewskiElena Blokhina
Published in: ICECS 2022 (2022)
Keyphrases
  • silicon on insulator
  • transmission electron microscopy
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  • electron beam
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