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A Delay-Adjustable, Self-Testable Flip-Flop for Soft-Error Tolerability and Delay-Fault Testability.
Dave Y.-W. Lin
Charles H.-P. Wen
Published in:
ACM Trans. Design Autom. Electr. Syst. (2021)
Keyphrases
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power dissipation
pattern recognition
signal processing
fault diagnosis
neural network
digital images
fault detection