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On the Effect of Defect Clustering on Test Transparency and IC Test Optimization.

Adit D. SinghC. Mani Krishna
Published in: IEEE Trans. Computers (1996)
Keyphrases
  • clustering algorithm
  • self organizing maps
  • clustering method
  • test data
  • data sets
  • genetic algorithm
  • artificial intelligence
  • optimization problems
  • data clustering
  • fuzzy clustering