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Repair techniques for aged TSVs in 3D integrated circuits.

Siroos MadaniKasem KhalilBappaditya DeyDevante BontonMagdy A. Bayoumi
Published in: HLDVT (2017)
Keyphrases
  • integrated circuit
  • damage assessment
  • failure rate
  • electron beam
  • databases
  • hardware description language
  • repair actions