Self acting production of tip for atomic force microscopy.
Tomas HyncicaMiroslav JuhasPublished in: IDAACS (1) (2011)
Keyphrases
- atomic force microscopy
- quality control
- production system
- production planning
- learning environment
- position and orientation
- semiconductor manufacturing
- information systems
- decision making
- d objects
- data sets
- artificial intelligence
- data mining
- production process
- production scheduling
- manufacturing processes
- neural network