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New Scan-Based Attack Using Only the Test Mode and an Input Corruption Countermeasure.
Sk Subidh Ali
Samah Mohamed Saeed
Ozgur Sinanoglu
Ramesh Karri
Published in:
VLSI-SoC (Selected Papers) (2013)
Keyphrases
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countermeasures
data corruption
machine learning
input data
power analysis
information systems
statistical tests
control system
information security