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Resilience of semiconductor optical amplifier with holding beam injection to reflections in bidirectional reciprocal operation.
Josef Vojtech
Jan Radil
Ondrej Havlis
Michal Altmann
Pavel Skoda
Vladimír Smotlacha
Published in:
ICTON (2016)
Keyphrases
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electron beam
missing data
fault tolerance
electron beam lithography
semiconductor devices
semiconductor manufacturing
dynamic range
optical imaging
fiber optic
liquid crystal
high sensitivity
neural network
steady state
search algorithm
image sequences
three dimensional
case study