High precision 3D measurement using area modulated phase-shifting binary patterns.
Haiqing HuangXiangzhong FangXiangyang LiQingchun LuHang RenPublished in: ICNC (2013)
Keyphrases
- high precision
- binary patterns
- phase shifting
- high recall
- structured light
- high frequency
- binary images
- transform domain
- gray level
- achieve high precision
- face recognition
- local binary pattern
- gray scale
- high accuracy
- spatio temporal
- shift invariant
- single image
- computer vision
- shape representation
- space time
- precision and recall
- facial expressions
- wavelet transform
- image data
- high resolution
- feature space
- video sequences
- image processing