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Native-Conflict and Stitch-Aware Wire Perturbation for Double Patterning Technology.
Shao-Yun Fang
Szu-Yu Chen
Yao-Wen Chang
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2012)
Keyphrases
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conflict resolution
rapid development
data processing
key technologies
image processing
cost effective
personal computer
technological advances
resolving conflicts
real time
databases
e learning
database systems
field of view
socio cognitive