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A single event upset tolerant latch with parallel nodes.

Changyong LiuNianlong LiuZhiting LinXiulong WuChunyu PengQiang ZhaoXuan LiJunning ChenXuan ZengXiangdong Hu
Published in: IEICE Electron. Express (2019)
Keyphrases
  • power consumption
  • parallel processing
  • parallel implementation
  • massively parallel
  • database systems
  • event detection
  • high density
  • parallel computing