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An Accumulator-Based BIST Approach for Two-Pattern Testing.
Ioannis Voyiatzis
Antonis M. Paschalis
Dimitris Nikolos
Constantin Halatsis
Published in:
J. Electron. Test. (1999)
Keyphrases
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pattern matching
hough transform
pattern discovery
machine learning
wide range
test cases
similar patterns
learning algorithm
knowledge base
image processing
preprocessing
artificial neural networks
mobile robot
test set
associative memory