A practical metric for soft error vulnerability analysis of combinational circuits.
Mohsen RajiHossein PedramBehnam GhavamiPublished in: Microelectron. Reliab. (2015)
Keyphrases
- distance measure
- asynchronous circuits
- high speed
- real world
- error metrics
- artificial neural networks
- error rate
- real time
- analog vlsi
- error estimates
- practical problems
- practical application
- metric space
- error bounds
- low cost
- image registration
- relative error
- error measure
- image sequences
- logic circuits
- information retrieval
- machine learning
- logic synthesis
- database