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Test set embedding into hardware generated sequences using an embedding algorithm.
Ioannis Voyiatzis
Dimitris J. Kavvadias
S. Sinitos
K. Vlahantonis
P. Kyrkos
Cleo Sgouropoulou
Costas Efstathiou
Published in:
DTIS (2015)
Keyphrases
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test set
training set
learning algorithm
optimal solution
database
training data
k means
detection algorithm
error rate
hardware implementation
detection method
test cases
multidimensional scaling