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Test set embedding into hardware generated sequences using an embedding algorithm.

Ioannis VoyiatzisDimitris J. KavvadiasS. SinitosK. VlahantonisP. KyrkosCleo SgouropoulouCostas Efstathiou
Published in: DTIS (2015)
Keyphrases
  • test set
  • training set
  • learning algorithm
  • optimal solution
  • database
  • training data
  • k means
  • detection algorithm
  • error rate
  • hardware implementation
  • detection method
  • test cases
  • multidimensional scaling