Full Sensitivity and Test Generation for Multiple-Valued Logic Circuits.

Elena Dubrova Dilian Gurov Jon C. Muzio

Published in: ISMVL (1994)

Keyphrases

test generation
multiple valued
logic circuits
multi valued
low power
test cases
file organization
boolean functions
quality assurance
static analysis
software testing
power consumption
continuous attributes
low cost
complex valued
high speed
power dissipation
feature selection
data sets
valued logic
neural network