A new method for junctionless transistors parameters extraction.
Renan Trevisoli DoriaRodrigo Trevisoli DoriaMichelly de SouzaMarcelo Antonio PavanelloSylvain BarraudPublished in: ESSDERC (2017)
Keyphrases
- computational cost
- preprocessing
- clustering method
- detection method
- significant improvement
- cost function
- parameter estimation
- high accuracy
- objective function
- classification method
- sensitivity analysis
- experimental evaluation
- dynamic programming
- pairwise
- parameter settings
- parameter space
- data sets
- fine tuning
- feature set
- high speed
- edge detection
- low cost
- probabilistic model