Built-in self-test with weighted random pattern hardware.
Franc BrglezClay S. Gloster Jr.Gershon KedemPublished in: ICCD (1990)
Keyphrases
- hardware and software
- low cost
- real time
- pattern matching
- built in self test
- computer systems
- uniformly distributed
- random number generator
- database
- hardware implementation
- standard pc
- weighted distance
- similar patterns
- high end
- graphics hardware
- information systems
- neural network
- high speed
- information retrieval
- general purpose
- evolutionary algorithm