Impact of transistor aging on RF low noise amplifier performance of 28nm technology: Reliability assessment.

Swaraj Mahato Georges G. E. Gielen

Published in: ICECS (2013)

Keyphrases

reliability assessment
nm technology
low power
high noise
power dissipation
low signal to noise ratio
high speed

bp neural network model
power consumption
high power
high sensitivity
power system
noise level
signal to noise ratio

radio frequency
random noise
low cost
genetic algorithm
software defect
dynamic range

noise reduction
noisy data
missing data
fuzzy logic
artificial neural networks
face recognition