Impact of transistor aging on RF low noise amplifier performance of 28nm technology: Reliability assessment.
Swaraj MahatoGeorges G. E. GielenPublished in: ICECS (2013)
Keyphrases
- reliability assessment
- nm technology
- low power
- high noise
- power dissipation
- low signal to noise ratio
- high speed
- bp neural network model
- power consumption
- high power
- high sensitivity
- power system
- noise level
- signal to noise ratio
- radio frequency
- random noise
- low cost
- genetic algorithm
- software defect
- dynamic range
- noise reduction
- noisy data
- missing data
- fuzzy logic
- artificial neural networks
- face recognition