Models and algorithms for bounds on leakage in CMOS circuits.
Mark C. JohnsonDinesh SomasekharKaushik RoyPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1999)
Keyphrases
- worst case
- learning algorithm
- computational cost
- optimization problems
- machine learning algorithms
- significant improvement
- average case
- upper and lower bounds
- high speed
- error bounds
- learning models
- theoretical analysis
- circuit design
- learned models
- lower and upper bounds
- linear models
- mathematical models
- low power
- computationally efficient
- low cost
- upper bound
- probabilistic model
- computational complexity