A Novel Heuristic Method for Application-Dependent Testing of a SRAM-Based FPGA Interconnect.
T. Nandha KumarFabrizio LombardiPublished in: IEEE Trans. Computers (2013)
Keyphrases
- high accuracy
- application dependent
- significant improvement
- synthetic data
- dynamic programming
- detection method
- support vector machine svm
- search methods
- high precision
- data sets
- computational cost
- cost function
- image registration
- support vector machine
- segmentation method
- classification method
- test data
- preprocessing
- combinatorial optimization
- objective function
- beam search
- similarity measure