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On-Chip Process Variability Monitoring Flow.

Nabila MoubdiPhilippe MaurineRobin WilsonSylvain EngelsNadine AzémardVincent DumettierPierre Busson
Published in: J. Low Power Electron. (2010)
Keyphrases
  • real time
  • artificial intelligence
  • low cost
  • machine learning
  • knowledge base
  • decision trees
  • monitoring system
  • flow patterns