Exact probabilistic testability measures for multi-output circuits.
Paolo CamuratiPaolo PrinettoMatteo Sonza ReordaPublished in: J. Electron. Test. (1990)
Keyphrases
- probability measures
- probabilistic model
- bayesian networks
- high speed
- decision trees
- generative model
- uncertain data
- probability values
- data driven
- posterior probability
- evaluation measures
- analog vlsi
- database
- continuous valued
- analog circuits
- exact and approximate
- quality measures
- belief networks
- conditional probabilities
- genetic algorithm
- real time