Defect Detection of MEMS Based on Data Augmentation, WGAN-DIV-DC, and a YOLOv5 Model.
Zhenman ShiMei SangYaokang HuangLun XingTiegen LiuPublished in: Sensors (2022)
Keyphrases
- data sets
- experimental data
- data collection
- database
- image data
- prior knowledge
- input data
- computational model
- data analysis
- probability distribution
- data structure
- simulation data
- similarity measure
- management system
- measured data
- test data
- high level
- data processing
- missing data
- probabilistic model
- synthetic data
- statistical methods
- raw data
- prior information
- expert knowledge
- empirical data
- data mining techniques
- defect detection