Optimize First, Buy Later: Analyzing Metrics to Ramp-Up Very Large Knowledge Bases.
Paea LePenduNatalya Fridman NoyClément JonquetPaul R. AlexanderNigam H. ShahMark A. MusenPublished in: ISWC (1) (2010)
Keyphrases
- knowledge base
- description logics
- knowledge representation
- knowledge based systems
- wordnet
- logic programming
- knowledge sources
- error metrics
- data mining
- meta knowledge
- formal representation
- similarity metrics
- evaluation methodology
- evaluation methods
- semantic network
- knowledge acquisition
- image quality
- multiscale
- e learning