Replica Bit-Line Technique for Internal Refresh in Logic-Compatible Gain-Cell Embedded DRAM.

Odem Harel Yarden Nachum Robert Giterman

Published in: Microelectron. J. (2020)

Keyphrases

random access memory
embedded dram
design considerations
low voltage
load balancing
dynamic random access memory
peer to peer
database systems
query processing
flash memory
memory access