Login / Signup
Variation tolerant CLSAs for nanoscale Bulk-CMOS and FinFET SRAM.
Ming-Fu Tsai
Jen-Huan Tsai
Ming-Long Fan
Pin Su
Ching-Te Chuang
Published in:
APCCAS (2012)
Keyphrases
</>
power consumption
random access memory
low power
low voltage
cmos technology
low cost
high speed
mechanical properties
data transmission
image sensor
real time
design considerations
face recognition
circuit design
single chip
power management
website
data sets
database
analog vlsi
nm technology