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In situ tensile testing of tin (Sn) whiskers in a focused ion beam (FIB)/scanning electron microscope (SEM).

Renuka VallabhaneniEhsan IzadiCarl R. MayerC. Shashank KairaSudhanshu S. SinghJagannathan RajagopalanNikhilesh Chawla
Published in: Microelectron. Reliab. (2017)
Keyphrases
  • scanning electron microscope
  • finite element
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  • test set
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  • neural network
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  • test data
  • software testing