Login / Signup
A Statistical Approach to Area-Constrained Yield Enhancement for Pipelined Circuits under Parameter Variations.
Animesh Datta
Swarup Bhunia
Saibal Mukhopadhyay
Kaushik Roy
Published in:
Asian Test Symposium (2005)
Keyphrases
</>
statistical models
image processing
high speed
statistical analysis
image enhancement
database
genetic algorithm
data driven
hypothesis testing
input parameters
objective function
low cost
information theoretic
parameter values
statistical tests