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On error modeling of electrical bugs for post-silicon timing validation.

Ming GaoPeter LishernessKwang-Ting ChengJing-Jia Liou
Published in: ASP-DAC (2012)
Keyphrases
  • error rate
  • low cost
  • high speed
  • database
  • information systems
  • test cases
  • error analysis
  • error propagation
  • neural network
  • software systems
  • physical characteristics
  • model validation