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A Statistical Model Including Parameter Matching for Analog Integrated Circuits Simulation.
Sususmu Inohira
Toshio Shinmi
Minoru Nagata
Toru Toyabe
Kyoichi Iida
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1985)
Keyphrases
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statistical model
integrated circuit
statistical models
statistical distribution
matching algorithm
probability model
electron beam
image matching
active appearance models
facial shape
feature matching