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A systematic approach to reducing semiconductor memory test time in mass production.
Jen-Chieh Yeh
Shyr-Fen Kuo
Cheng-Wen Wu
Chih-Tsun Huang
Chao-Hsun Chen
Published in:
MTDT (2005)
Keyphrases
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mass production
life cycle
real time
data mining
e learning
domain knowledge
computer aided
dynamic systems